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Advantest Sp.adr : Advantest Introduces New T5503 Memory Test Solution for Low-Cost, High-Volume Production of Next-Generation High-Speed DDR3-SDRAM Memory

23/04/2008 | 18:24


TOKYO, April 23 /PRNewswire-FirstCall/ -- Advantest Corporation
(TSE: 6857, NYSE: ATE) today announced its new T5503 high-throughput memory
test system, boasting the industry's highest parallel test capability of up to
128 devices. The T5503 was developed specifically to address the challenges of
high-volume production test of next-generation high-speed DDR3-SDRAM memory.
The memory tester will be available from August 2008 and will also be on
display at the "Advantest Tour de Force 2008" exhibition to be held at the
Tokyo International Forum, June 3-5.




Adoption of Next-Generation DDR3-SDRAM Necessitates Low-Cost Test Solution



As computers become more and more sophisticated, DRAM, used largely as the
main memory storage in computers, is continually being replaced with new
generations of products that have ever increasing capabilities. The race to
achieve higher device speeds and multiple functionality is rapidly advancing
in high-performance PCs as the demand for lifelike graphics with audiovisual
equipment, including digital TVs and game consoles, continues to escalate.
Consequently, these and other machines are driving a shift toward increased
employment of very high-speed memory devices, such as DDR3-SDRAM.



Next-generation DDR3-SDRAM boasts low power consumption through a reduced
operating voltage of 1.5V, compared to the DDR2-SDRAM's 1.8V, as well as
higher speed and higher volume data processing. Because of these generational
advantages, manufacturers are transitioning to DDR3-SDRAM, and it is predicted
to be in high demand in a wide variety of fields, ranging from high-end
desktop computers to notebook computers and digital consumer electronics. As a
result, price competition between IC manufacturers is predicted to escalate,
driving an increased demand for volume-production solutions that deliver lower
overall cost-of-test.



The introduction of the T5503 reinforces Advantest's market leadership in
delivering advanced technology solutions for its global customers'
next-generation test requirements.




Parallel test of up to 128 DDR3-SDRAM devices



The T5503 enables package test of up to 128 DDR3-SDRAM devices
simultaneously. This is double that of the company's previous models, enabling
a major reduction in test costs for high volume production lines. Furthermore,
with maximum test speeds of 3.2Gbps and data transmission speeds of over
1Gbps, it is the fastest in the industry, making it an ideal solution for
high-volume production testing of DDR3-SDRAM, as well as for GDDR3 and GDDR4.




40% reduction in space and 45% reduction in power consumption



The tester's semiconductor circuitry makes full use of the latest CMOS
technology to achieve greater packaging density, reducing the footprint by
approximately 40% over the previous model, and leading to space savings in
high-volume production lines. Power consumption has also been reduced by
approximately 45% compared to the system's predecessor, enabling
environmentally friendly operation.




Equipped with Advantest's unique multi-strobe capabilities



Advantest's proprietary multi-strobe capabilities, introduced in the
company's previous model, T5501, have been further enhanced in the T5503.
Supporting source-synchronous test with the use of multi-strobe technology
that measures the phase difference between data output from the device and the
reference clock signal at each clock cycle, the system provides high-speed,
high-precision test.




Key Specifications
Test Devices: DDR3-SDRAM, GDDR3, GDDR4 etc.
Parallel Test Capacity: Up to 128 units
Maximum Test Speed: 3.2Gbps



About Advantest



Advantest Corporation is the world's leading automatic test equipment
supplier to the semiconductor industry, and also produces electronic and
optoelectronic instruments and systems. A global company, Advantest has long
offered total ATE solutions, and serves the industry in every component of
semiconductor test: tester, handler, mechanical and electrical interfaces, and
software. Its logic, memory, mixed-signal and RF testers and device handlers
are integrated into the most advanced semiconductor production lines in the
world. Founded in Tokyo in 1954, Advantest established its first subsidiary in
1982, in the USA, and now has subsidiaries worldwide. Among them, Advantest
America, Inc. is based in Santa Clara, CA, and Advantest (Europe) GmbH is
based in Munich, Germany. More information is available at www.advantest.com




SOURCE Advantest Corporation



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